Delay fault coverage: A realistic metric and an estimation technique for distributed path delay faults

IEEE/ACM International Conference on Computer-Aided Design, Digest of Technical Papers

Volumn , Issue , 1996, Pages 494-501

  Sivaraman, Mukund ^a   Strojwas, Andrzej J ^a  

^a CARNEGIE MELLON UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

FAILURE ANALYSIS; MATHEMATICAL MODELS; PARAMETER ESTIMATION; PROBABILITY;

DELAY FAULT COVERAGE;

ELECTRONIC EQUIPMENT MANUFACTURE;

EID: 0030381850     PISSN: 10923152     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (20)