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Thin Solid Films

Volumn 391, Issue 1, 2001, Pages 42-46

X-Ray diffraction line broadening by stacking faults in SrBi2Nb2O9/SrTiO3 epitaxial thin films

(5) Boulle, A a Legrand, C b Guinebretiere R a Mercurio, J P b Dauger, A a

a Ecole Nationale Superieure de Ceramique Industrielle (France)

b UNIVERSITY OF LIMOGES (France)

Author keywords

Epitaxy; Layered pevovskite; Line profile analysis; X Ray diffraction

Indexed keywords

ANNEALING; CRYSTALLIZATION; EPITAXIAL GROWTH; FILM PREPARATION; FOURIER TRANSFORMS; GRAIN SIZE AND SHAPE; PEROVSKITE; SOL-GELS; STACKING FAULTS; STRAIN; STRONTIUM COMPOUNDS; SUBSTRATES; THIN FILMS; X RAY DIFFRACTION ANALYSIS;

LINE PROFILE ANALYSIS; LORENTZIAN THEORY; MICROSTRAINS;

DIELECTRIC FILMS;

EID: 0035797002 PISSN: 00406090 EISSN: None Source Type: Journal
DOI: 10.1016/S0040-6090(01)00975-0 Document Type: Article

Times cited : (23)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.