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Volumn 19, Issue 6-7, 1999, Pages 1379-1381

Structural characterisation of sol-gel SrBi2Nb2O9 thin film deposited on (001) SrTiO3 single crystal

Author keywords

Films; Heteroepitaxy; Niobates; Sol gel processes; X ray methods

Indexed keywords

BISMUTH COMPOUNDS; COATING TECHNIQUES; CRYSTAL ORIENTATION; EPITAXIAL GROWTH; MULTILAYERS; NIOBIUM COMPOUNDS; SINGLE CRYSTALS; SOL-GELS; THIN FILMS; X RAY CRYSTALLOGRAPHY;

EID: 0032652920     PISSN: 09552219     EISSN: None     Source Type: Journal    
DOI: 10.1016/s0955-2219(98)00440-3     Document Type: Article
Times cited : (20)

References (6)
  • 1
    • 35348846979 scopus 로고
    • Ferroelectric memories
    • Desu S.B., Vijay D.P. Ferroelectric memories. Science. 246:1989;1400.
    • (1989) Science , vol.246 , pp. 1400
    • Desu, S.B.1    Vijay, D.P.2
  • 3
    • 85087242279 scopus 로고    scopus 로고
    • Ph.D. thesis, University of Limoges, France
    • 9 ferroelectric thin films. Ph.D. thesis, University of Limoges, France, 1998.
    • (1998) 9 Ferroelectric Thin Films
    • Yi, J.H.1
  • 4
    • 0020113625 scopus 로고
    • Characterization of thin layers on perfect crystals with a multipurpose high resolution X-ray diffractometer
    • Bartels W.J. Characterization of thin layers on perfect crystals with a multipurpose high resolution X-ray diffractometer. J. Vac. Sci. Tech. B1:(2):1983;338.
    • (1983) J. Vac. Sci. Tech. , vol.1 , Issue.2 , pp. 338
    • Bartels, W.J.1
  • 5
    • 2542513318 scopus 로고    scopus 로고
    • Reflexion Debye-Scherrer powder diffraction with flat plate sample using CPS 120 INEL: D-spacing accuracy and Rietveld refinement
    • Masson O., Guinebretiére R., Dauger A. Reflexion Debye-Scherrer powder diffraction with flat plate sample using CPS 120 INEL: d-spacing accuracy and Rietveld refinement. J. Appl. Cryst. 29:1996;540.
    • (1996) J. Appl. Cryst. , vol.29 , pp. 540
    • Masson, O.1    Guinebretiére, R.2    Dauger, A.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.