High-resolution transmission electron microscopy study on the solid-phase crystallization of amorphous SrBi2Ta2O9 thin films on Si

Journal of Crystal Growth

Volumn 223, Issue 1-2, 2001, Pages 161-168

  Choi, Jae Hyoung ^a   Lee, Jeong Yong ^a   Kim, Yong Tae ^b  

^a Korea Advanced Institute of Science and Technology (KAIST)   (South Korea)

^b Korea Institute of Science and Technology   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS FILMS; CRYSTAL ORIENTATION; CRYSTALLIZATION; GRAIN GROWTH; NUCLEATION; OXIDES; PHASE INTERFACES; STRONTIUM COMPOUNDS; THIN FILMS; TRANSMISSION ELECTRON MICROSCOPY;

ANTIPHASE BOUNDARY;

DIELECTRIC FILMS;

EID: 0034825463     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0022-0248(00)01000-9     Document Type: Article

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