High-resolution electron microscopy investigations on stacking faults in SrBi2Ta2O9 ferroelectric thin films

Applied Physics Letters

Volumn 78, Issue 7, 2001, Pages 973-975

  Zhu, X H ^a,b   Li, A D ^a   Wu, D ^a   Zhu, T ^a   Liu, Z G ^a   Ming, N B ^a  

^a NANJING UNIVERSITY   (China)

^b HONG KONG POLYTECHNIC UNIVERSITY   (Hong Kong)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0013119822     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1332106     Document Type: Article

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