Bismuth volatility effects on the perfection of SrBi2Nb2O9 and SrBi2Ta2O9 films

Applied Physics Letters

Volumn 82, Issue 26, 2003, Pages 4711-4713

  Zurbuchen, M A ^a   Lettieri, J ^a   Fulk, S J ^a   Jia, Y ^a   Carim, A H ^c   Schlom, D G ^b  

^a PENNSYLVANIA STATE UNIVERSITY   (United States)

^b ARGONNE NATIONAL LABORATORY   (United States)

^c U S DEPARTMENT OF ENERGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DEFECTS; DESORPTION; FERROELECTRIC THIN FILMS; STOICHIOMETRY; TRANSMISSION ELECTRON MICROSCOPY;

VOLATILITY EFFECTS;

FILM GROWTH;

EID: 0038105424     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1574406     Document Type: Article

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