|
Volumn 188-189, Issue 1-3 SPEC.ISS., 2004, Pages 409-414
|
Effects of deposition temperature and bilayer thickness on the mechanical properties of AlN/TiN multilayer thin films
a
EPFL
(Switzerland)
|
Author keywords
AlN TiN multilayers; Bilayer thickness; Hardness enhancement; Magnetron sputtering; Microstructures
|
Indexed keywords
ALUMINUM NITRIDE;
EPITAXIAL GROWTH;
GRAIN SIZE AND SHAPE;
MAGNETRON SPUTTERING;
MULTILAYERS;
TRANSMISSION ELECTRON MICROSCOPY;
X RAY DIFFRACTION ANALYSIS;
BIAXIAL RESIDUAL STRESSES;
BILAYER THICKNESS;
CROSS-SECTIONAL ELECTRON MICROSCOPY;
STRUCTURAL MODIFICATIONS;
THIN FILMS;
FILM;
FILM THICKNESS;
|
EID: 14644397275
PISSN: 02578972
EISSN: None
Source Type: Journal
DOI: 10.1016/j.surfcoat.2004.08.039 Document Type: Article |
Times cited : (29)
|
References (18)
|