Conductance distribution in nanometer-sized semiconductor devices due to dopant statistics

Physical Review B - Condensed Matter and Materials Physics

Volumn 69, Issue 3, 2004, Pages

  Smit, G D J ^a   Rogge, S ^a   Caro, J ^a   Klapwijk, T M ^a  

^a DELFT UNIVERSITY OF TECHNOLOGY   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

METAL;

ARTICLE; ATOM; CALCULATION; CONDUCTANCE; DEVICE; DIODE; ELECTRONICS; LOW TEMPERATURE; NANOPARTICLE; ROOM TEMPERATURE; SEMICONDUCTOR; STATISTICAL ANALYSIS; TEMPERATURE MEASUREMENT;

EID: 1442288189     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.69.035338     Document Type: Article

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