High-resolution transmission electron microscopy imaging of misfit-dislocation networks at Cu-MgO and Cu-MnO interfaces

Philosophical Magazine A: Physics of Condensed Matter, Structure, Defects and Mechanical Properties

Volumn 79, Issue 9, 1999, Pages 2083-2101

  Groen, H B ^a   Kooi, B J ^a   Vellinga, W P ^a   De Hosson, J Th M ^a,b  

^a UNIVERSITY OF GRONINGEN   (Netherlands)

^b EINDHOVEN UNIVERSITY OF TECHNOLOGY   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0040707173     PISSN: 01418610     EISSN: None     Source Type: Journal    
DOI: 10.1080/01418619908210410     Document Type: Article

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