Structure of misfit dislocations in niobium-sapphire interfaces and strength of interfacial bonding: An atomistic study

Acta Materialia

Volumn 47, Issue 15, 1999, Pages 4143-4152

  Levay, A ^a,b,c   Mobus G ^a   Vitek, V ^b   Ruhle M ^a   Tichy, G ^c  

^a MAX PLANCK INSTITUTE FOR INTELLIGENT SYSTEMS   (Germany)

^b UNIVERSITY OF PENNSYLVANIA   (United States)

^c EÖTVÖS LORÁND UNIVERSITY   (Hungary)

Author keywords

[No Author keywords available]

Indexed keywords

ADHESION; BOND STRENGTH (MATERIALS); CERAMIC MATERIALS; COMPUTER SIMULATION; CRYSTAL ATOMIC STRUCTURE; CRYSTAL ORIENTATION; DIFFUSION IN SOLIDS; DISLOCATIONS (CRYSTALS); HIGH RESOLUTION ELECTRON MICROSCOPY; NIOBIUM; SAPPHIRE;

INTERFACIAL BONDING;

INTERFACES (MATERIALS);

EID: 0343061013     PISSN: 13596454     EISSN: None     Source Type: Journal    
DOI: 10.1016/S1359-6454(99)00273-6     Document Type: Article

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