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Volumn 126, Issue 3, 2004, Pages 359-366

Analysis of the micro-mechanical properties in aged lead-free, fine pitch flip chip joints

Author keywords

[No Author keywords available]

Indexed keywords

AGING OF MATERIALS; GRAIN GROWTH; INDENTATION; INTERFACES (MATERIALS); JOINTS (STRUCTURAL COMPONENTS); LEAD; MICROSTRUCTURE; RECRYSTALLIZATION (METALLURGY); RELIABILITY; SHEAR STRENGTH; SOLDERING ALLOYS; STRESS CONCENTRATION;

EID: 12344297639     PISSN: 10437398     EISSN: None     Source Type: Journal    
DOI: 10.1115/1.1773391     Document Type: Article
Times cited : (6)

References (19)
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    • Zeng, K., and Tu, K. N., 2002, "Six Cases of Reliability Study of Pb-Free Solder Joints in Electronic Packaging Technology," Mater. Sci. Eng., R., 38, pp. 55-105.
    • (2002) Mater. Sci. Eng., R. , vol.38 , pp. 55-105
    • Zeng, K.1    Tu, K.N.2
  • 11
    • 0036292985 scopus 로고    scopus 로고
    • UBM (Under bump metallization) study for Pb-Free electroplating bumping: Interface reaction and electromigration
    • New York, IEEE
    • Jang, S. Y., Wolf, J., Kwon, W. S., and Paik, K. W., 2002, "UBM (Under Bump Metallization) Study for Pb-Free Electroplating Bumping: Interface Reaction and Electromigration," Proceedings of the 52nd Electronic Components & Technology Conference, New York, IEEE, pp. 1213-1220.
    • (2002) Proceedings of the 52nd Electronic Components & Technology Conference , pp. 1213-1220
    • Jang, S.Y.1    Wolf, J.2    Kwon, W.S.3    Paik, K.W.4
  • 12
    • 0036294956 scopus 로고    scopus 로고
    • Flip-chip reliability: Comparative characterization of lead free (Sn/Ag/Cu) and 63Sn/Pb eutectic solder
    • New York, IEEE
    • Balkan, H., D. Patterson, et al., 2002, "Flip-chip Reliability: Comparative Characterization of Lead Free (Sn/Ag/Cu) and 63Sn/Pb Eutectic Solder," Proceedings of the 52nd Electronic Components & Technology Conference, New York, IEEE, pp. 1263-1269.
    • (2002) Proceedings of the 52nd Electronic Components & Technology Conference , pp. 1263-1269
    • Balkan, H.1    Patterson, D.2
  • 14
    • 0036296077 scopus 로고    scopus 로고
    • Effect of Au on interfacial reactions of eutectic SnPb and snAgCu solders with al/Ni(V)/Cu thin film metallization
    • New York, IEEE
    • Zhang, F., Chum, C. C., and Li, M., 2002, "Effect of Au on Interfacial Reactions of Eutectic SnPb and SnAgCu Solders with Al/Ni(V)/Cu Thin Film Metallization." Proceedings of the 52nd Electronic Components & Technology Conference, New York, IEEE, pp. 726-731.
    • (2002) Proceedings of the 52nd Electronic Components & Technology Conference , pp. 726-731
    • Zhang, F.1    Chum, C.C.2    Li, M.3
  • 15
    • 0026875935 scopus 로고
    • An improved technique for determining hardness and elastics modulus using load and displacement sensing indentation experiments
    • Oliver, W. C., and Pharr, G. M., 1992, "An Improved Technique for Determining Hardness and Elastics Modulus Using Load and Displacement Sensing Indentation Experiments," J. Mater. Res., 7(6), June, pp. 1564-1583.
    • (1992) J. Mater. Res. , vol.7 , Issue.6 JUNE , pp. 1564-1583
    • Oliver, W.C.1    Pharr, G.M.2
  • 16
    • 0036646898 scopus 로고    scopus 로고
    • Investigating the fracture resistance and adhesion of DLC films with micro-impact testing
    • Beake, B. D., Goodes, S. R., Smith, J. F., et al., 2002, "Investigating the Fracture Resistance and Adhesion of DLC Films with Micro-impact Testing," Diamond Relat. Mater., 11(8), August, pp. 1606-1609.
    • (2002) Diamond Relat. Mater. , vol.11 , Issue.8 AUGUST , pp. 1606-1609
    • Beake, B.D.1    Goodes, S.R.2    Smith, J.F.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.