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Volumn , Issue , 2003, Pages 323-330

A reliability comparison of lead free and eutectic solder for stencil printing based flip-chip applications

Author keywords

[No Author keywords available]

Indexed keywords

ASSEMBLY; FLIP CHIP DEVICES; HIGH TEMPERATURE TESTING; PRINTING; RELIABILITY; SCANNING ELECTRON MICROSCOPY; SHORT CIRCUIT CURRENTS; SOLDERING ALLOYS;

EID: 0038350987     PISSN: 05695503     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (6)

References (9)
  • 1
    • 24644487902 scopus 로고    scopus 로고
    • Impact of intermetallic growth on the mechanical strength of lead-free BGA assemblies
    • IPC SMEMA Council APEX
    • Patrick Rouboud, Grace Ng, Ronald Bulwith, Robert Herber, Swaminath Prasad, Flynn Carson, Sundar Kamath, Alexander Garcia, "Impact of Intermetallic Growth on the Mechanical Strength of Lead-Free BGA Assemblies", IPC SMEMA Council APEX 2001, LF2-3-1 to LF2-3-5.
    • (2001)
    • Rouboud, P.1    Ng, G.2    Bulwith, R.3    Herber, R.4    Prasad, S.5    Carson, F.6    Kamath, S.7    Garcia, A.8
  • 2
    • 0003511126 scopus 로고    scopus 로고
    • Low cost flip chip technologies
    • McGraw-Hill, New York, NY
    • John H. Lau, "Low Cost Flip Chip Technologies", McGraw-Hill, New York, NY, 2000.
    • (2000)
    • Lau, J.H.1
  • 3
    • 0035359656 scopus 로고    scopus 로고
    • Pb-free solders for flip-chip interconnects
    • D. R. Frear, J. W. Jang, J. K. Lin and C. Zhang, "Pb-Free Solders for Flip-Chip Interconnects", Journal of Material Vol. 53, No. 6, 2001, pp.28-32.
    • (2001) Journal of Material , vol.53 , Issue.6 , pp. 28-32
    • Frear, D.R.1    Jang, J.W.2    Lin, J.K.3    Zhang, C.4
  • 5
    • 84954219534 scopus 로고    scopus 로고
    • Influences of pad shape and solder microstructure on shear force of low cost flip chip bumps
    • J. Cai, Simon P. C. Law, Annette Teng, Philip C. H. Chan, "Influences of Pad Shape and Solder Microstructure on Shear Force of Low Cost Flip Chip Bumps," EMAPS 2000.
    • EMAPS 2000
    • Cai, J.1    Law, S.P.C.2    Teng, A.3    Chan, P.C.H.4
  • 6
    • 51249162222 scopus 로고
    • Analysis of low temperature intermetallic growth in copper-tin diffusion couples
    • Mar.
    • Z. Mei, A. J. Sunwoo, and J. W. Morris, Jr., "Analysis of Low Temperature intermetallic growth in copper-tin diffusion couples", Metall. Trans. A, vol. 23A, pp. 857-864, Mar. 1992.
    • (1992) Metall. Trans. A , vol.23 A , pp. 857-864
    • Mei, Z.1    Sunwoo, A.J.2    Morris J.W., Jr.3
  • 7
    • 0035455153 scopus 로고    scopus 로고
    • The growth of intermetallic compounds at Sn-Ag-Cu solder/Cu and Sn-Ag-Cu solder/Ni interfaces and the associated evolution of the solder microstructure
    • A. Zribi, A. Clark, L.Zavalij, P. Borgesen, and E. J. Cotts, "The growth of Intermetallic Compounds at Sn-Ag-Cu Solder/Cu and Sn-Ag-Cu Solder/Ni Interfaces and the Associated Evolution of the Solder Microstructure", Journal of Electronic Materials Vol. 30, No. 6, 2001, pp.1157-1163.
    • (2001) Journal of Electronic Materials , vol.30 , Issue.6 , pp. 1157-1163
    • Zribi, A.1    Clark, A.2    Zavalij, L.3    Borgesen, P.4    Cotts, E.J.5
  • 9
    • 0033222086 scopus 로고    scopus 로고
    • Effect of thermal cycles on the mechanical strength of quad flat pack leads/Sn-3.5Ag-X (X=Bi and Cu) solder joints
    • Y. Kariya, Y. Hirata, and M. Otsuka, "Effect of Thermal Cycles on the Mechanical Strength of Quad Flat Pack Leads/Sn-3.5Ag-X (X=Bi and Cu) Solder Joints", Journal of Electronic Material Vol. 28, No. 11, 1999, pp.1263-1269.
    • (1999) Journal of Electronic Material , vol.28 , Issue.11 , pp. 1263-1269
    • Kariya, Y.1    Hirata, Y.2    Otsuka, M.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.