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Volumn , Issue , 2003, Pages 58-63

Pb-free solder challenges in electronic packaging and assembly

Author keywords

[No Author keywords available]

Indexed keywords

ASSEMBLY; ELECTRON DEVICE MANUFACTURE; FLIP CHIP DEVICES; MICROPROCESSOR CHIPS; MICROSTRUCTURE; SOLDERING; SURFACE MOUNT TECHNOLOGY;

EID: 0037675719     PISSN: 05695503     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (15)

References (20)
  • 1
    • 0003083557 scopus 로고    scopus 로고
    • Lead-free solders for electronic assembly
    • Edited by R.K. Mahidhara, D.R. Fear, S.M.L. Sastry, K.L. Murty, P.K. Liaw and W. Winterbottom
    • F. Hua, "Lead-free solders for electronic assembly", Design and reliability of solder and Solder Interconnections. Edited by R.K. Mahidhara, D.R. Fear, S.M.L. Sastry, K.L. Murty, P.K. Liaw and W. Winterbottom, pp. 65-73.
    • Design and Reliability of Solder and Solder Interconnections , pp. 65-73
    • Hua, F.1
  • 3
    • 0037818756 scopus 로고    scopus 로고
    • NCMS Pb-free solder report
    • NCMS Pb-free solder report
  • 4
    • 0037818757 scopus 로고    scopus 로고
    • Prismark LLC Electronics Industry Report
    • Prismark LLC Electronics Industry Report 2002.
    • (2002)
  • 5
    • 0038495056 scopus 로고    scopus 로고
    • Anomalous creep in Sn-Rich solder joints
    • H.G. Song, J.W. Morris, Jr. and F. Hua, "Anomalous Creep in Sn-Rich Solder Joints",Trans. JIM, 48 (2002) 1847
    • (2002) Trans. JIM , vol.48 , pp. 1847
    • Song, H.G.1    Morris J.W., Jr.2    Hua, F.3
  • 6
    • 0036611639 scopus 로고    scopus 로고
    • Creep properties of Pb-free solder joints
    • H.G. Song, J.W. Morris, Jr. and F. Hua, "Creep Properties of Pb-Free Solder Joints", J. Metals, 54 (2002) 30
    • (2002) J. Metals , vol.54 , pp. 30
    • Song, H.G.1    Morris J.W., Jr.2    Hua, F.3
  • 8
    • 0037818754 scopus 로고    scopus 로고
    • unpublished communication
    • N. Chawla, F. Hua unpublished communication 2002.
    • (2002)
    • Chawla, N.1    Hua, F.2
  • 9
    • 0036539629 scopus 로고    scopus 로고
    • Underfill constrain effects during thermal-mechanical cycling of flip chip solder joints
    • I. Datta, A. Gopinath and C. Marshall, "Underfill Constrain Effects during Thermal-Mechanical Cycling of Flip Chip Solder Joints", J. Electronic Material, 31, pp 253-264, 2002.
    • (2002) J. Electronic Material , vol.31 , pp. 253-264
    • Datta, I.1    Gopinath, A.2    Marshall, C.3
  • 10
    • 0038156423 scopus 로고    scopus 로고
    • Development of lead (Pb) and halogen free peripheral leaded and PBGA components to meet MSL3 260C peak reflow
    • Work presented by the research team from Motorola at EGG
    • Alan Woosley, Geoff Swan, T.S. Chong, Linda Matsushita, Thomas Koschmieder and Kennon Simmons, "Development of Lead (Pb) and Halogen Free Peripheral Leaded and PBGA Components to Meet MSL3 260C Peak Reflow", Work presented by the research team from Motorola at EGG, 2001
    • (2001)
    • Woosley, A.1    Swan, G.2    Chong, T.S.3    Matsushita, L.4    Koschmieder, T.5    Simmons, K.6
  • 11
    • 0037818752 scopus 로고    scopus 로고
    • Review of electronics packaging issues in ITRS 2001
    • 2001 ITRS roadmap, Chi Shih Chang "Review of Electronics packaging Issues in ITRS 2001".
    • 2001 ITRS Roadmap
    • Chang, C.S.1
  • 14
    • 0037481138 scopus 로고    scopus 로고
    • The effect of temperature range during thermal cycling on thermomechanical fatigue behavior of selected Pb-free solders
    • James C. Bartelo, "The effect of temperature range during thermal cycling on thermomechanical fatigue behavior of selected Pb-free solders", ECTC proceeding 2002.
    • ECTC Proceeding 2002
    • Bartelo, J.C.1
  • 20
    • 0037076832 scopus 로고    scopus 로고
    • Reliability issues of Pb-free solder joints in electronic packaging technology
    • K. Zeng and K. N. Tu, "Reliability Issues of Pb-free Solder Joints in Electronic packaging Technology", Materials Science and Engineering Report: A Review Journal, Vol R38, pp55-105, 2002
    • (2002) Materials Science and Engineering Report: A Review Journal , vol.R38 , pp. 55-105
    • Zeng, K.1    Tu, K.N.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.