Dedicated instrumentation for high sensitivity, low frequency noise measurement systems

Fluctuation and Noise Letters

Volumn 4, Issue 2, 2004, Pages

  Ciofi, C ^a   Giusi, G ^a   Scandurra, G ^a   Neri, B ^b  

^a Dipto di Fisica della Materia e TFA   (Italy)

^b Dipto Ingegneria dell'Informazione   (Italy)

Author keywords

Electron device; Low noise instrumentation; Noise measurements; Spectral analysis

Indexed keywords

EID: 12144281587     PISSN: 02194775     EISSN: None     Source Type: Journal    
DOI: 10.1142/S0219477504001963     Document Type: Article

References (20)

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