Electromigration noise measurements using a novel AC/DC wafer-level noise measurement system

IEEE Transactions on Electron Devices

Volumn 44, Issue 1, 1997, Pages 180-184

  Yassine, Abdullah M ^a   Chen, Charles Tsong Ming ^b  

^a University of South Florida   (United States)

^b ADVANCED MICRO DEVICES   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BRIDGE CIRCUITS; COMPUTATIONAL METHODS; ELECTRIC CURRENTS; GAIN MEASUREMENT; NATURAL FREQUENCIES; SILICON WAFERS; THERMAL NOISE; THIN FILMS;

ELECTROMIGRATION NOISE MEASUREMENT; WAFER LEVEL NOISE MEASUREMENT SYSTEM;

ELECTROMIGRATION;

EID: 0030867155     PISSN: 00189383     EISSN: None     Source Type: Journal    
DOI: 10.1109/16.554808     Document Type: Article

References (8)

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2. R.D. Black, W. M. Snow, and M. B. Weissman, "Nonscalar I/f conductivity fluctuations in carbon, gold, and chrome films," Phys. Rev. B, vol. 25, no. 4, p. 25, 1982.
3. H. Stoll, "Analysis of resistance fluctuations independent of thermal voltage noise," Appl. Phys., vol. 22, p. 185, 1980.
4. M.B. Weissman, Ph.D. dissertation, University of California, San Diego, 1976.
5. H. Verbruggen, H. Stoll, K. Heeck, and R. H. Koch, "A novel technique for measuring resistance fluctuations independently of background noise," Appl. Phys. A. vol. 48, 1989.
6. 2 voltage spectra in the high-Tc superconducting transition region," in Noise in Physical Systems and I// Fluctuations, AIP Conference P roc. P. Handel and A. L. Chung, Eds., 1993, no. 285, p. 111.
7. 2 noise and resistance transients in Al-based thin films," submitted for publication.
8. A.M. Yassine, "Wafer-Level noise measurement system for reliability testing of vlsi interconnects," Ph.D. dissertation, University of South Florida, Tampa, May 1995. Available from UMI, 300 North Zeeb Road, Ann Arbor, MI 48106-1346, USA.