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1
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0023456307
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Electromigration and low-frequency resistance fluctuations in aluminum thin-film interconnections
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B. Neri, A. Diligenti, and P. E. Bagnoli, "Electromigration and low-frequency resistance fluctuations in aluminum thin-film interconnections," IEEE Trans. Electron Devices, vol. ED-34, pp. 2317-2322, 1987.
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(1987)
IEEE Trans. Electron Devices
, vol.ED-34
, pp. 2317-2322
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Neri, B.1
Diligenti, A.2
Bagnoli, P.E.3
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2
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0024481529
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A study of electromigration in aluminum and aluminum-silicon thin film resistors using noise technique
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A. Diligenti, P. E. Bagnoli, B. Neri, S. Bea, and L. Mantellassi, "A study of electromigration in aluminum and aluminum-silicon thin film resistors using noise technique," Solid State Electron., vol. 32, pp. 11-16, 1989.
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(1989)
Solid State Electron.
, vol.32
, pp. 11-16
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-
Diligenti, A.1
Bagnoli, P.E.2
Neri, B.3
Bea, S.4
Mantellassi, L.5
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3
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0030274026
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Wafer level measurement system for noise characterization of electromigration
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C. Ciofi, M. De Marinis, and B. Neri, "Wafer level measurement system for noise characterization of electromigration," Microelectron. Reliab., vol. 36, pp. 1851-1854, 1996.
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(1996)
Microelectron. Reliab.
, vol.36
, pp. 1851-1854
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Ciofi, C.1
De Marinis, M.2
Neri, B.3
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4
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0343930035
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Minimization of low-frequency noise sources in electronic measurements
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IMEKO, Budapest, Hungary
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B. Pellegrini, R. Saletti, B. Neri, and P. Terreni, "Minimization of low-frequency noise sources in electronic measurements," in Noise in Electrical Measurements, Proc. 1st Int. Symp. Measurement of Electrical Quantities, IMEKO, Budapest, Hungary, 1987, pp. 195-200.
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(1987)
Noise in Electrical Measurements, Proc. 1st Int. Symp. Measurement of Electrical Quantities
, pp. 195-200
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Pellegrini, B.1
Saletti, R.2
Neri, B.3
Terreni, P.4
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5
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0029332671
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Voltage and current sources for ultra low noise measurement systems
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Luglio-Agosto
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C. Ciofi, M. De Marinis, and B. Neri, "Voltage and current sources for ultra low noise measurement systems," Alta Frequenza, vol. 7, pp. 55-58, Luglio-Agosto, 1995.
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(1995)
Alta Frequenza
, vol.7
, pp. 55-58
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Ciofi, C.1
De Marinis, M.2
Neri, B.3
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6
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0026907744
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Evaluation of simple constant current sources for silicon diode thermometers
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T. Haruyama and P. C. McDonald, "Evaluation of simple constant current sources for silicon diode thermometers," Meas. Sci. Technol., vol. 3, pp. 713-717, 1992.
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(1992)
Meas. Sci. Technol.
, vol.3
, pp. 713-717
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Haruyama, T.1
McDonald, P.C.2
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7
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0031347999
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Ultra low-noise, programmable, voltage source
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Dec.
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L. Baracchino, G. Basso, C. Ciofi, and B. Neri, "Ultra low-noise, programmable, voltage source," IEEE Trans. Instrum. Meas., vol. 46, pp. 1256-1261, Dec. 1997.
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(1997)
IEEE Trans. Instrum. Meas.
, vol.46
, pp. 1256-1261
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Baracchino, L.1
Basso, G.2
Ciofi, C.3
Neri, B.4
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8
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0029703562
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Ultra low noise, PC-based measurement system for the characterization of the metallizations of integrated circuits
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Brussels, Belgium
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C. Ciofi, M. De Marinis, and B. Neri, "Ultra low noise, PC-based measurement system for the characterization of the metallizations of integrated circuits," in Proc. IMTC'96 Conf., Brussels, Belgium, 1996, p. 319.
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(1996)
Proc. IMTC'96 Conf.
, pp. 319
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Ciofi, C.1
De Marinis, M.2
Neri, B.3
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