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Volumn 47, Issue 1, 1998, Pages 78-81

Ultra low-noise current sources

Author keywords

Batteries; Circuit noise; Circuit synthesis; Current supplies; Dc generators; Noise

Indexed keywords

ELECTRIC CURRENTS; SOLID STATE DEVICES; SPURIOUS SIGNAL NOISE; ZENER DIODES;

EID: 0031988252     PISSN: 00189456     EISSN: None     Source Type: Journal    
DOI: 10.1109/19.728794     Document Type: Article
Times cited : (24)

References (8)
  • 1
    • 0023456307 scopus 로고
    • Electromigration and low-frequency resistance fluctuations in aluminum thin-film interconnections
    • B. Neri, A. Diligenti, and P. E. Bagnoli, "Electromigration and low-frequency resistance fluctuations in aluminum thin-film interconnections," IEEE Trans. Electron Devices, vol. ED-34, pp. 2317-2322, 1987.
    • (1987) IEEE Trans. Electron Devices , vol.ED-34 , pp. 2317-2322
    • Neri, B.1    Diligenti, A.2    Bagnoli, P.E.3
  • 2
    • 0024481529 scopus 로고
    • A study of electromigration in aluminum and aluminum-silicon thin film resistors using noise technique
    • A. Diligenti, P. E. Bagnoli, B. Neri, S. Bea, and L. Mantellassi, "A study of electromigration in aluminum and aluminum-silicon thin film resistors using noise technique," Solid State Electron., vol. 32, pp. 11-16, 1989.
    • (1989) Solid State Electron. , vol.32 , pp. 11-16
    • Diligenti, A.1    Bagnoli, P.E.2    Neri, B.3    Bea, S.4    Mantellassi, L.5
  • 3
    • 0030274026 scopus 로고    scopus 로고
    • Wafer level measurement system for noise characterization of electromigration
    • C. Ciofi, M. De Marinis, and B. Neri, "Wafer level measurement system for noise characterization of electromigration," Microelectron. Reliab., vol. 36, pp. 1851-1854, 1996.
    • (1996) Microelectron. Reliab. , vol.36 , pp. 1851-1854
    • Ciofi, C.1    De Marinis, M.2    Neri, B.3
  • 5
    • 0029332671 scopus 로고
    • Voltage and current sources for ultra low noise measurement systems
    • Luglio-Agosto
    • C. Ciofi, M. De Marinis, and B. Neri, "Voltage and current sources for ultra low noise measurement systems," Alta Frequenza, vol. 7, pp. 55-58, Luglio-Agosto, 1995.
    • (1995) Alta Frequenza , vol.7 , pp. 55-58
    • Ciofi, C.1    De Marinis, M.2    Neri, B.3
  • 6
    • 0026907744 scopus 로고
    • Evaluation of simple constant current sources for silicon diode thermometers
    • T. Haruyama and P. C. McDonald, "Evaluation of simple constant current sources for silicon diode thermometers," Meas. Sci. Technol., vol. 3, pp. 713-717, 1992.
    • (1992) Meas. Sci. Technol. , vol.3 , pp. 713-717
    • Haruyama, T.1    McDonald, P.C.2
  • 8
    • 0029703562 scopus 로고    scopus 로고
    • Ultra low noise, PC-based measurement system for the characterization of the metallizations of integrated circuits
    • Brussels, Belgium
    • C. Ciofi, M. De Marinis, and B. Neri, "Ultra low noise, PC-based measurement system for the characterization of the metallizations of integrated circuits," in Proc. IMTC'96 Conf., Brussels, Belgium, 1996, p. 319.
    • (1996) Proc. IMTC'96 Conf. , pp. 319
    • Ciofi, C.1    De Marinis, M.2    Neri, B.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.