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Volumn 51, Issue 4, 2002, Pages 656-659

A new method for high-sensitivity noise measurements

Author keywords

Correlation; Noise measurement; Spectral analysis; Time domain analysis

Indexed keywords

AMPLIFIERS (ELECTRONIC); CORRELATION METHODS; DISCRETE FOURIER TRANSFORMS; ELECTRIC CURRENTS; ELECTRIC POTENTIAL; MOSFET DEVICES; RESISTORS; SPECTRUM ANALYSIS; SPECTRUM ANALYZERS; TIME DOMAIN ANALYSIS;

EID: 0036703604     PISSN: 00189456     EISSN: None     Source Type: Journal    
DOI: 10.1109/TIM.2002.803080     Document Type: Article
Times cited : (24)

References (6)
  • 1
    • 0034322231 scopus 로고    scopus 로고
    • Low-frequency noise measurements as a characterization tool for degradation phenomena in solid-state devices
    • C. Ciofi and B. Neri, "Low-frequency noise measurements as a characterization tool for degradation phenomena in solid-state devices," J. Phys. D, vol. 33, 2000. R199.
    • (2000) J. Phys. D , vol.33 , pp. R199
    • Ciofi, C.1    Neri, B.2
  • 2
    • 0026103155 scopus 로고
    • Very sensitive measurement method of electron device current noise
    • Feb
    • M. Macucci and B. Pellegrini, "Very sensitive measurement method of electron device current noise," IEEE Trans. Instrum. Meas., vol. 40, pp. 7-12, Feb. 1991.
    • (1991) IEEE Trans. Instrum. Meas. , vol.40 , pp. 7-12
    • Macucci, M.1    Pellegrini, B.2
  • 4
    • 0001498069 scopus 로고    scopus 로고
    • Spectrum analyzer with noise reduction by cross correlation technique on two channels
    • M. Sampietro, L. Fasoli, and G. Ferrari, "Spectrum analyzer with noise reduction by cross correlation technique on two channels," Rev. Sci. Instrum., vol. 70, no. 5, pp. 2520-2525, 1999.
    • (1999) Rev. Sci. Instrum. , vol.70 , Issue.5 , pp. 2520-2525
    • Sampietro, M.1    Fasoli, L.2    Ferrari, G.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.