Very low-noise, high-accuracy programmable voltage reference

IEEE Transactions on Instrumentation and Measurement

Volumn 52, Issue 4, 2003, Pages 1251-1254

  Pace, C ^a   Ciofi, C ^b   Crupi, F ^a  

^a Dipartimento di Elettronica   (Italy)

^b Dipto di Fisica della Materia e TFA   (Italy)

Author keywords

Automatic testing; Low frequency measurements; Low noise instrumentation; Spectral analysis; Voltage reference

Indexed keywords

ANALOG TO DIGITAL CONVERSION; AUTOMATIC TESTING; DIGITAL TO ANALOG CONVERSION; ELECTRIC POTENTIAL; GATES (TRANSISTOR); JUNCTION GATE FIELD EFFECT TRANSISTORS; LEAKAGE CURRENTS; SPECTRUM ANALYSIS;

POWER SPECTRAL DENSITY; VOLTAGE REFERENCE;

SIGNAL NOISE MEASUREMENT;

EID: 0141885219     PISSN: 00189456     EISSN: None     Source Type: Journal    
DOI: 10.1109/TIM.2003.816823     Document Type: Article

References (4)

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3. R. J. W. Jonker, J. Briaire, and L. K. J. Vandamme, "Automated system for noise-measurements on low-ohmic samples and magnetic sensors," IEEE Trans. Instrum. Meas., vol. 48, p. 730, June 1999.
4. L. Baracchino, G. Basso, C. Ciofi, and B. Neri, "Ultralow-noise programmable, voltage source," IEEE Trans. Instrum. Meas., vol. 46, p. 1256, Oct. 1997.