Temperature controlled oven for low noise measurement systems

IEEE Transactions on Instrumentation and Measurement

Volumn 49, Issue 3, 2000, Pages 546-549

  Ciofi, Carmine ^b   Ciofi, Ivan ^b   Pascoli, Stefano Di ^b   Neri, Bruno ^a,b  

^a IEEE

^b UNIVERSITY OF PISA   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTROMIGRATION; FREQUENCIES; INTEGRATED CIRCUIT MANUFACTURE; LOW PASS FILTERS; OVENS; TEMPERATURE; TEMPERATURE CONTROL; THERMAL EFFECTS; THERMAL VARIABLES MEASUREMENT;

LOW FREQUENCY NOISE MEASUREMENT; TEMPERATURE CONTROLLED OVEN; THERMAL FLUCTUATIONS;

ELECTRIC VARIABLES MEASUREMENT;

EID: 0034204766     PISSN: 00189456     EISSN: None     Source Type: Journal    
DOI: 10.1109/19.850392     Document Type: Article

References (4)

1. B. Neri, C. Ciofi, and V. Dattilo, "Noise and fluctuation in Al-Si inter-connect lines," IEEE Trans. Electron Devices, vol. 44, pp. 1454-1459, Sept. 1997.
2. C. Ciofi, M. D. Marinis, and B. Neri, "Ultralow-noise PC-based measurement system for the characterization of the metallizations of integrated circuits," IEEE Trans. Instrum. Meas., vol. 46, pp. 789-793, Aug. 1997.
3. L. Baracchino, G. Basso, C. Ciofi, and B. Neri, "Ultra low noise, programmable, voltage source," IEEE Trans. Instrum. Meas., vol. 46, pp. 1256-1261, Dec. 1997.
4. F. Kreith, Principles of Heat Transfer. New York: Educational, 1973.