Ultralow-noise PC-based measurement system for the characterization of the metallizations of integrated circuits

IEEE Transactions on Instrumentation and Measurement

Volumn 46, Issue 4, 1997, Pages 789-793

  Ciofi, Carmine ^b   De Marinis, Marco ^b   Neri, Bruno ^a,b  

^a IEEE

^b UNIVERSITY OF PISA   (Italy)

Author keywords

Data acquisition; Digital control; Electromigration; Noise measurement; Spectral analysis

Indexed keywords

DATA ACQUISITION; DIGITAL CONTROL SYSTEMS; ELECTROMIGRATION; METALLIZING; PERSONAL COMPUTERS; SIGNAL NOISE MEASUREMENT; SPECTRUM ANALYSIS;

ULTRALOW NOISE PC BASED MEASUREMENT SYSTEM;

DIGITAL INTEGRATED CIRCUITS;

EID: 0031200284     PISSN: 00189456     EISSN: None     Source Type: Journal    
DOI: 10.1109/19.650774     Document Type: Article

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