Laser diode reliability: Crystal defects and degradation modes

Comptes Rendus Physique

Volumn 4, Issue 6, 2003, Pages 663-673

  Jiménez, Juan ^a  

^a UNIVERSITY OF VALLADOLID   (Spain)

Author keywords

Catastropic degradation; Dark line defects; Dark spot defects; Degradation; Dislocation climb; Dislocation glide; Recombination enhanced defect reaction

Indexed keywords

EID: 10744233276     PISSN: 16310705     EISSN: None     Source Type: Journal    
DOI: 10.1016/S1631-0705(03)00097-5     Document Type: Short Survey

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