Electron microscopy of life-tested semiconductor laser diodes

Micron

Volumn 31, Issue 3, 2000, Pages 259-267

  Vanzi, M ^a   Bonfiglio, A ^a   Magistrali, F ^b   Salmini, G ^b  

^a UNIVERSITY OF CAGLIARI   (Italy)

^b Pirelli Labs SpA   (Italy)

Author keywords

Catastrophical optical damage; EBIC; Focused ion beam; Laser diode; Life test; Recombination enhanced defect reaction; Reliability; Transmission electron microscopy

Indexed keywords

EID: 0034048910     PISSN: 09684328     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0968-4328(99)00092-X     Document Type: Conference Paper

References (8)

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2. Bonfiglio A., Casu M.B., Magistrali F., Maini M., Salmini G., Vanzi M. A different approach to the analysis of data in life-tests of laser diodes. Microelectronics Reliability. 38:(5):1998;767-771.
3. Donolato C. A reciprocity theorem for charge collection. Applied Physics Letter. 46:(3):1985;270-272.
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5. Magistrali, F., Maini, M., Salmini, G., Vanzi, M., 1995. Analysis of 980 nm SL SQW InGaAs pump laser degradations. Proceedings of the 21st International Symposium for Testing and Failure Analysis ISTFA/95, Santa Clara, California, November, pp. 171-176.
6. Magistrali F., Salmini G., Martines G., Vanzi M., 1996. Charge diffusion and reciprocity theorems: a direct approach to EBIC of ridge laser diodes. Proceedings of the 22nd International Symposium for Testing and Failure Analysis ISTFA96, Los Angeles, California, November, pp. 233-238.
7. Ueda O. Reliability and Degradation of III-V Optical Devices. 1996;Artech House, Norwood, MA.
8. Vanzi M., 1995. The rules of the rue morgue. Proceedings of the 21st International Symposium for Testing and Failure Analysis ISTFA95, Santa Clara, California, November, pp. 249-256.