Facet degradation of high-power diode laser arrays

Applied Physics A: Materials Science and Processing

Volumn 70, Issue 4, 2000, Pages 377-381

  Tomm, J W ^a   Thamm, E ^a   Barwolff A ^a   Elsaesser, T ^a   Luft, J ^b   Baeumler, M ^c   Mueller, S ^c   Jantz, W ^c   Rechenberg, I ^d   Erbert, G ^d  

^a MAX BORN INSTITUT   (Germany)

^b OSRAM OPTO SEMICONDUCTORS GMBH   (Germany)

^c FRAUNHOFER INSTITUTE FOR APPLIED SOLID STATE PHYSICS IAF   (Germany)

^d LEIBNIZ INSTITUT FÜR HÖCHSTFREQUENZTECHNIK   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

FAILURE (MECHANICAL); RAMAN SPECTROSCOPY; TEMPERATURE; THERMAL LOAD;

CATASTROPHICAL OPTICAL MIRROR DAMAGE; FACET DEGRADATION; HIGH POWER DIODE LASER ARRAYS; MICRO RAMAN FACET TEMPERATURE; PLANE VIEW PHOTOLUMINESCENCE MICROSCOPY; SURFACE TEMPERATURE MEASUREMENT; ULTRAHIGH POWER OPERATION;

SEMICONDUCTOR LASERS;

EID: 0034172208     PISSN: 09478396     EISSN: None     Source Type: Journal    
DOI: 10.1007/s003390051051     Document Type: Article

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