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Volumn , Issue , 2004, Pages 95-100

Testing of hard faults in simultaneous multithreaded processors

Author keywords

[No Author keywords available]

Indexed keywords

DYNAMIC IMPLEMENTATION VERIFICATION ARCHITECTURE (DIVA); ONLINE TESTING; POWER CONSUMPTION; VARIABLE FREQUENCY;

EID: 10444240260     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/OLT.2004.1319665     Document Type: Conference Paper
Times cited : (9)

References (31)
  • 1
    • 0021390888 scopus 로고
    • Fault-tolerant design techniques for semiconductor memory applications
    • F. J. Aichelmann, "Fault-tolerant design techniques for semiconductor memory applications", IBM Journal of Research and Development, 28(2): 177-183, 1984.
    • (1984) IBM Journal of Research and Development , vol.28 , Issue.2 , pp. 177-183
    • Aichelmann, F.J.1
  • 2
    • 0033321638 scopus 로고    scopus 로고
    • DIVA: A reliable substrate for deep submicron microarchitecture design
    • T. Austin, "DIVA: a reliable substrate for deep submicron microarchitecture design", in International Symposium on Microarchitecture, pp. 197-207, 1999.
    • (1999) International Symposium on Microarchitecture , pp. 197-207
    • Austin, T.1
  • 4
    • 0025462640 scopus 로고
    • Low-voltage hot-electron currents and degradation in deep-submicrometer MOSFETs
    • J. E. Chung, M. C. Jeng, J. E. Moon, P. K. Ko, and C. Hu, "Low-voltage hot-electron currents and degradation in deep-submicrometer MOSFETs", in IEEE Transactions on Electron Devices, 37(7):1651-1657, 1990.
    • (1990) IEEE Transactions on Electron Devices , vol.37 , Issue.7 , pp. 1651-1657
    • Chung, J.E.1    Jeng, M.C.2    Moon, J.E.3    Ko, P.K.4    Hu, C.5
  • 5
    • 0042078549 scopus 로고    scopus 로고
    • A survey of rollback-recovery protocols in message-passing systems
    • E. N. Elnozahy, L. Alvisi, Y. M. Wang, and D. B. Johnson. "A survey of rollback-recovery protocols in message-passing systems", in ACM Computing Survey, 34(3):375-408, 2002.
    • (2002) ACM Computing Survey , vol.34 , Issue.3 , pp. 375-408
    • Elnozahy, E.N.1    Alvisi, L.2    Wang, Y.M.3    Johnson, D.B.4
  • 7
    • 0036495930 scopus 로고    scopus 로고
    • Online testing approach for very deep-submicron ICs
    • M. Favalli, and C. Metra, "Online testing approach for very deep-submicron ICs", in IEEE Design & Test of Computers, 19(2):16-23, 2002.
    • (2002) IEEE Design & Test of Computers , vol.19 , Issue.2 , pp. 16-23
    • Favalli, M.1    Metra, C.2
  • 8
    • 10444254821 scopus 로고    scopus 로고
    • The simulator for multithreaded computer architecture
    • University of Minnesota
    • J. Huang, "The Simulator for Multithreaded Computer Architecture", Technical Report No: ARTiC-00-05, University of Minnesota, 2000.
    • (2000) Technical Report No: ARTiC-00-05 , vol.ARTIC-00-05
    • Huang, J.1
  • 10
    • 0020278451 scopus 로고
    • Simple and efficient algorithms for functional RAM testing
    • M. Marinescu. "Simple and efficient algorithms for functional RAM testing", International Test Conference, pp. 236-239, 1982.
    • (1982) International Test Conference , pp. 236-239
    • Marinescu, M.1
  • 14
    • 84862484290 scopus 로고    scopus 로고
    • Online Publication
    • Online Publication. IBM Chipkill Memory, http://www.pc.ibm.com/qtechinfo/MCGN6AMOP.html, 2001.
    • (2001) IBM Chipkill Memory
  • 17
    • 84862474932 scopus 로고    scopus 로고
    • Online Publication
    • Online Publication. Ultrasparc IV Processor, http://www.sun.com/processors/Ultrasparc-IV/us4_datasheet.pdf.
    • Ultrasparc IV Processor
  • 18
    • 84862482121 scopus 로고    scopus 로고
    • Online Reference. Simplescalar LLC
    • Online Reference. Simplescalar LLC, http://www.simplescalar.com, 2003.
    • (2003)
  • 21
    • 10444261327 scopus 로고    scopus 로고
    • Personal communications with various researchers for the microprocessor industry and EDA vendors such as IBM, Intel, Sun, Mentor Graphics, Cadence, and Synopsis
    • Personal communications with various researchers for the microprocessor industry and EDA vendors such as IBM, Intel, Sun, Mentor Graphics, Cadence, and Synopsis.
  • 23
    • 0032597692 scopus 로고    scopus 로고
    • AR-SMT: A microarchitectural approach to fault tolerance in microprocessors
    • E. Rotenberg, "AR-SMT: A microarchitectural approach to fault tolerance in microprocessors", in International Symposium on Fault-Tolerant Computing, pp. 84-91, 1999.
    • (1999) International Symposium on Fault-Tolerant Computing , pp. 84-91
    • Rotenberg, E.1
  • 30
    • 0018491847 scopus 로고
    • A reliable spaceborne memory with a single error and erasure correction scheme
    • W. K. S. Walker, C. W. Sundberg, and C. J. Black, "A reliable spaceborne memory with a single error and erasure correction scheme", in IEEE Transaction on Computers, 28(7):493-500, 1979.
    • (1979) IEEE Transaction on Computers , vol.28 , Issue.7 , pp. 493-500
    • Walker, W.K.S.1    Sundberg, C.W.2    Black, C.J.3
  • 31
    • 0003894724 scopus 로고    scopus 로고
    • GLACIER: A hot carrier gate level circuit characterization and simulation system for VLSI design
    • L. Wu et al., "GLACIER: a hot carrier gate level circuit characterization and simulation system for VLSI design", in Proceedings of the International Symposium on Quality Electronic, pp. 73-79, 2000.
    • (2000) Proceedings of the International Symposium on Quality Electronic , pp. 73-79
    • Wu, L.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.