Efficient signature-based fault diagnosis using variable size windows

Proceedings of the IEEE International Conference on VLSI Design

Volumn , Issue , 2001, Pages 391-396

  Clouqueur, Thomas ^a   Ercevik, Ozen ^a   Saluja, Kewal K ^a   Takahashi, Hiroshi ^b  

^a University of Wisconsin Madison   (United States)

^b EHIME UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ERROR DETECTION; FAILURE ANALYSIS; PROBABILITY DISTRIBUTIONS; PROGRAM DIAGNOSTICS;

BENCHMARK CIRCUITS; FAULT DIAGNOSIS;

FAULT TOLERANT COMPUTER SYSTEMS;

EID: 0034998857     PISSN: 10639667     EISSN: None     Source Type: Journal    
DOI: 10.1109/ICVD.2001.902690     Document Type: Article

References (0)