Investigation of capillary forces using atomic force microscopy

Langmuir

Volumn 17, Issue 25, 2001, Pages 7823-7829

  Malotky, David L ^a   Chaudhury, Manoj K ^a  

^a Lehigh University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

LIQUID DROPLETS;

ATOMIC FORCE MICROSCOPY; CAPILLARITY; CONTACT ANGLE; DEPOSITION; DROP FORMATION; INTERFACIAL ENERGY; LIQUIDS; NANOTECHNOLOGY; SILICA; SILICON WAFERS; SILICONE COATINGS;

WETTING;

EID: 0035846798     PISSN: 07437463     EISSN: None     Source Type: Journal    
DOI: 10.1021/la0107796     Document Type: Article

References (26)

1. Binnig, G.; Quate, C.F.; et al. Surf. Sci. 1987, 1, 189.
2. Weisenhorn, A.L.; Hansma, P.K.; Albrecht, T.R.; Quate, C.F. Appl. Phys. Lett. 1988, 54, 2651.
3. Burnham, N.A.; Colton, R.J.; Pollock, H.M. Nanotechnology 1993, 4, 64.
4. Mate, C.M. Phys. Rev. Lett. 1992, 68, 3323. Mate, C.M.; Lorenz, M.R.; Novotny, V.J. J. Chem. Phys. 1989, 90, 7550.
5. M ate, C.M. Phys. Rev. Lett. 1992, 68, 3323. Mate, C.M.; Lorenz, M.R.; Novotny, V.J. J. Chem. Phys. 1989, 90, 7550.
6. Doppenschmidt, A.; Butt, H.J. Langmuir 2000, 16, 6709.
7. Piner, R.D.; Zhu, J.; Hong, S.; Mirkin, C.A. Science 1999, 238, 661.
8. Hwang, J.S. Ball Grid Array and Fine Pitch Interconnections; Electrochemical Publications: Bristol, 1995.
9. Pitois, O.; Moucheront, P.; Chateau, X. J. Colloid Interface Sci. 2000, 231, 26.
10. Simons, S.J.R.; Fairbrother, R.J. Powder Technol. 2000, 110, 44.
11. Ducker, W.A.; Senden, T.J.; Pashley, R.M. Nature 1991, 353, 239.
12. Orr, F.M.; Scriven, L.E.; Rivas, A.P. J. Fluid Mech. 1975, 67, 723.
13. 13,14.
14. 13,14.
15. Chaudhury, M.K.; Whitesides, G.M. Science 1992, 256, 1539.
16. Daniels, S.; Chaudhury, M.K.; Chen, J.C. Science 2001, 291, 633.
17. De Gennes, P.G. Rev. Mod. Phys. 1985, 57 (3, Pt. 1), 827 and references therein.
18. 1/2 in time t.
19. 16.
20. Voue, M.; Valignat, M.P.; Oshanin, G.; Cazabat, A.M.; De Conick, J. Langmuir 1998, 14, 5951. Cazabat, A.M.; Valignat, M.P.; Villette, S.; De Coninck, J.; Louche, F. Langmuir 1997, 13, 4754 and references therein.
21. Voue, M.; Valignat, M.P.; Oshanin, G.; Cazabat, A.M.; De Conick, J. Langmuir 1998, 14, 5951. Cazabat, A.M.; Valignat, M.P.; Villette, S.; De Coninck, J.; Louche, F. Langmuir 1997, 13, 4754 and references therein.
22. The disjoining pressure is not strictly equal to the Laplace pressure as the liquid continues to flow because of the gradient of disjoining pressure.
23. This grating consists of an array of tips with a small radii of curvature (< 10 nm) and tip angle (<20°). Imaging of this grating in contact mode produces a convolution of the grating tip and the experimental tip. This technique is useful for determining the approximate dimensions of an experimental tip.
24. While this agreement is quite excellent, we wish to point out that a similar experiment performed on a silicon wafer just after it is treated with an oxygen plasma yields a force as high as 20 nN. A force of this magnitude cannot be explained on the basis of the Laplace equation alone. We believe that the origin of such high adhesive forces could be the bridging interactions between the tip and substrate caused by the PDMS chains.
25. Vitt, E.; Shull, K.R. Macromolecules 1995, 28, 6349.
26. Force constants were calculated using the method described in Cleveland, J.P.; Manne, S.; Bocek, D.; Hansma, P.K. Rev. Sci. Instrum. 1993, 64, 403.