Interrelation between nanostructure and optical properties of oxide thin films by spectroscopic ellipsometry

Surface and Coatings Technology

Volumn 151-152, Issue , 2002, Pages 2-8

  Losurdo, M ^a   Barreca, D ^b   Capezzuto, P ^a   Bruno, G ^a   Tondello, E ^b  

^a UNIVERSITY OF BARI   (Italy)

^b UNIVERSITY OF PADOVA   (Italy)

Author keywords

Indium tin oxide (ITO); Nanostructured films; Optical properties; SnO2; Spectroscopi ellipsometry; V2O5

Indexed keywords

APPROXIMATION THEORY; ELLIPSOMETRY; GRAIN SIZE AND SHAPE; INDIUM COMPOUNDS; NANOSTRUCTURED MATERIALS; OPTICAL PROPERTIES; OSCILLATORS (ELECTRONIC); PLASMA ENHANCED CHEMICAL VAPOR DEPOSITION; SPECTROSCOPIC ANALYSIS; SUBSTRATES; TIN COMPOUNDS;

INDIUM TIN OXIDES (ITO);

THIN FILMS;

FILM; NANOSTRUCTURE; OPTICAL FEATURE; OXIDE;

EID: 0036495307     PISSN: 02578972     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0257-8972(01)01617-6     Document Type: Article

References (12)