Simplified system based on photoelastic modulation technique for low-level birefringence measurement

Review of Scientific Instruments

Volumn 74, Issue 11, 2003, Pages 4745-4749

  Peng, H J ^a   Wong, S P ^a   Lai, Y W ^a   Liu, X H ^a   Ho, H P ^a   Zhao, Shounan ^b  

^a CHINESE UNIVERSITY OF HONG KONG   (Hong Kong)

^b SOUTH CHINA UNIVERSITY OF TECHNOLOGY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; APPROXIMATION THEORY; BIREFRINGENCE; LIGHT MODULATORS; RESIDUAL STRESSES; SCANNING; SIGNAL PROCESSING; SILICON WAFERS;

LOW-LEVEL BIREFRINGENCE DETECTION (LLBD); PHOTOELASTIC MODULATION;

PHOTOELASTICITY;

EID: 0344515261     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1614875     Document Type: Article

References (14)

1. S. P. Wong, W. Y. Cheung, N. Ke, M. R. Sajan, W. S. Guo, L. Huang, and S. Zhao, Mater. Chem. Phys. 51, 157 (1997).
2. H. J. Peng, S. P. Wong, W. F. Lau, N. Ke, and S. Zhao, Mater. Res. Soc. Symp. Proc. 563, 303 (1999).
3. M. Herms, M. Fukuzawa, V. G. Melov, J. Schreiber, P. Mock, and M. Yamada, J. Cryst. Growth 210, 172 (2000).
4. M. Fukuzawa and M. Yamada, J. Cryst. Growth 229, 22 (2001).
5. S. P. Wong, H. J. Peng, and S. Zhao, Appl. Phys. Lett. 79, 1628 (2001).
6. X. Ma, M. Parker, and S. Sudarshan, Appl. Phys. Lett. 80, 3298 (2002).
7. H. J. Peng, S. P. Wong, and S. Zhao, J. Phys. D 35, L95 (2002).
8. B. Wang and T. C. Oakberg, Rev. Sci. Instrum. 70, 3847 (1999).
9. B. Wang and W. Hellman, Rev. Sci. Instrum. 72, 4066 (2001).
10. B. Wang, Opt. Eng. (Bellingham) 41, 981 (2002).
11. D. S. Kliger, J. W. Lewis, and C. E. Randall, Polarized Light in Optics and Spectroscopy (Academic, London, 1990).
12. H. Aben and C. Guillemet, Photoelasticity of Glass (Springer, New York, 1993).
13. B. Wang, Proc. SPIE 4399, 89 (2001).
14. S. P. Timoshenko and J. N. Goodier, Theory of Elasticity, 3d ed. (McGraw-Hill, New York, 1970).