A near infrared linear birefringence measurement system using a photoelastic modulator

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 4399, Issue , 2001, Pages 89-97

  Wang, Baoliang Bob ^a  

^a Hinds Instruments Incorporated   (United States)

Author keywords

Birefringence; Exicor; Near infrared; Photoelastic modulator; Silicon; Waveplates

Indexed keywords

BIREFRINGENCE; INFRARED RADIATION; LASERS; LIGHT MEASUREMENT; PHOTOELASTICITY; SILICON WAFERS;

PHOTOELASTIC MODULATORS (PEM);

LIGHT MODULATORS;

EID: 0035758345     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.445578     Document Type: Conference Paper

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