A new instrument for measuring both the magnitude and angle of low level linear birefringence

Review of Scientific Instruments

Volumn 70, Issue 10, 1999, Pages 3847-3854

  Wang, Baoliang ^a   Oakberg, Theodore C ^a  

^a Hinds Instruments Incorporated   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001302923     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1150000     Document Type: Article

References (20)

1. J. C. Kemp, J. Opt. Soc. Am. 59, 950 (1969).
2. M. Billardon and J. Badoz, Compt. Rend. Acad. Sci. Paris, Ser. B 262, 1672 (1966).
3. L. F. Mollenauer, D. Downie, H. Engstrom, and W. B. Grant, Appl. Opt. 8, 661 (1969).
4. J. C. Kemp, G. D. Henson, C. T. Steiner, and E. R. Powell, Nature (London) 326, 270 (1987).
5. D. Wroblewski and L. L. Lao, Rev. Sci. Instrum. 63, 5140 (1992).
6. K. Sato, Jpn. J. Appl. Phys., Part 1 20, 2403 (1981).
7. J. Badoz, M. Billardon, J. C. Canit, and M. F. Russel, J. Opt. (Paris) 8, 373 (1977).
8. S. N. Jasperson and S. E. Schnatterly, Rev. Sci. Instrum. 40, 761 (1969).
9. G. E. Jellison, Jr. and F. A. Modine, Appl. Opt. 29, 959 (1990); 36, 8184 (1997).
10. G. E. Jellison, Jr. and F. A. Modine, Appl. Opt. 29, 959 (1990); 36, 8184 (1997).
11. A. F. Drake, J. Phys. E 19, 170 (1986).
12. J. Schellman and H. P. Jensen, Chem. Rev. 87, 1359 (1987).
13. S. J. Johnson, Ph.D. thesis, Stanford University, 1985.
14. Y. Shindo and H. Hanabusa, Polym. Commun. 24, 240 (1983).
15. P. L. Frattini, Ph.D. thesis, Stanford University, 1986.
16. T. C. Oakberg, Proc. SPIE 2873, 17 (1996).
17. B. L. Wang, Proc. SPIE 3424, 120 (1998).
18. For example, see D. S. Kliger, J. W. Lewis, and C. E. Randall, Polarized Light in Optics and Spectroscopy (Academic, San Diego, CA, 1990), Chap. 4, pp. 75-83.
19. D. Collier and W. Pantley, Semiconductor Online, feature article, May 5, 1999.
20. R. DeJule, Semicond. Int. 22, 36 (1999).