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Volumn 41, Issue 5, 2002, Pages 981-987

Linear birefringence measurement instrument using two photoelastic modulators

Author keywords

Birefringence; Photoelastic modulator; Polarimeter; Polarization modulation

Indexed keywords

AMPLIFIERS (ELECTRONIC); BIREFRINGENCE; COMPUTER SIMULATION; FREQUENCIES; HELIUM NEON LASERS; LIGHT POLARIZATION; MATRIX ALGEBRA; PHOTODETECTORS; PHOTODIODES; PHOTOELASTICITY; POLARIMETERS; SILICON;

EID: 0036576324     PISSN: 00913286     EISSN: None     Source Type: Journal    
DOI: 10.1117/1.1467667     Document Type: Article
Times cited : (43)

References (23)
  • 6
  • 8
    • 0034317389 scopus 로고    scopus 로고
    • Dual polarization modulation: A real-time, spectral-multiple separation of circular dichroism from linear birefringence spectral intensities
    • (2000) Appl. Spectrosc. , vol.54 , pp. 1634-1645
    • Nafie, L.A.1
  • 12
    • 49149140093 scopus 로고
    • Recent developments in instrumentation in ellipsometry
    • (1980) Surf. Sci. , vol.96 , pp. 108
    • Hauge, P.S.1
  • 19
    • 0033650789 scopus 로고    scopus 로고
    • Further evaluation of the Exicor birefringence measurement system
    • (2000) Proc. SPIE , vol.4103 , pp. 12-18
    • Wang, B.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.