Identification of defect sites on oxide surfaces by metastable impact electron spectroscopy

Progress in Surface Science

Volumn 74, Issue 1-8, 2003, Pages 141-159

  Wendt, S ^a   Kim, Y D ^a   Goodman, D W ^a  

^a TEXAS A AND M UNIVERSITY   (United States)

Author keywords

Carbon monoxide; Metastable impact electron spectroscopy (MIES); MgO; Silver; SiO2; Surface defects; Ultraviolet photoelectron spectroscopy (UPS); Xenon

Indexed keywords

CRYSTAL DEFECTS; ENERGY GAP; MAGNESIA; MOLYBDENUM; PHOTOELECTRON SPECTROSCOPY; SURFACE STRUCTURE; THIN FILMS; ULTRAVIOLET SPECTROSCOPY;

METASTABLE IMPACT ELECTRON SPECTROSCOPY (MIES);

SILICA;

EID: 0242270949     PISSN: 00796816     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.progsurf.2003.08.011     Document Type: Conference Paper

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