Chemical and spectroscopic studies of metal oxide surfaces

Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films

Volumn 14, Issue 3 pt 2, 1996, Pages 1526-1531

  Goodman, D W ^a  

^a TEXAS A AND M UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AUGER ELECTRON SPECTROSCOPY; CATALYSTS; CRYSTAL STRUCTURE; ELECTRON ENERGY LOSS SPECTROSCOPY; ELECTRONIC PROPERTIES; INFRARED SPECTROSCOPY; MASS SPECTROMETERS; OXIDES; STOICHIOMETRY; SURFACES; TEMPERATURE PROGRAMMED DESORPTION; X RAY PHOTOELECTRON SPECTROSCOPY;

AUGER TRANSITIONS; INFRARED REFLECTION ABSORPTION SPECTROSCOPY; ION SCATTERING SPECTROSCOPY; THIN OXIDE FILMS;

THIN FILMS;

EID: 0030148239     PISSN: 07342101     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.580290     Document Type: Article

References (78)