E′ centers in amorphous SiO2 revisited: A new look at an old problem

Physical Review Letters

Volumn 86, Issue 24, 2001, Pages 5522-5525

  Uchino, T ^a   Takahashi, M ^a   Yoko, T ^a  

^a KYOTO UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS MATERIALS; CHEMICAL BONDS; COMPUTER SIMULATION; CONFORMATIONS; CRYSTAL DEFECTS; HOLE TRAPS; MATHEMATICAL MODELS; MICROSCOPIC EXAMINATION; PARAMAGNETIC RESONANCE; RELAXATION PROCESSES;

MICROSCOPIC STRUCTURE; OXYGEN DEFICIENCY CENTER; PARAMAGNETIC DEFECT CENTERS;

SILICA;

EID: 0035844586     PISSN: 00319007     EISSN: None     Source Type: Journal    
DOI: 10.1103/PhysRevLett.86.5522     Document Type: Article

References (29)