Ag adsorption on various silica thin films

Langmuir

Volumn 19, Issue 19, 2003, Pages 7929-7932

  Kim, Y D ^a   Wei, T ^a   Wendt, S ^a   Goodman, D W ^a  

^a TEXAS A AND M UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COVALENT BOND; CRYSTALLINE SILICA; METASTABLE IMPACT ELECTRON SPECTROSCOPY; THREE-DIMENSIONAL GROWTH; TWO-DIMENSIONAL GROWTH; ULTRAVIOLET PHOTOELECTRON SPECTROSCOPY;

ADSORPTION; CATALYSIS; CHEMICAL BONDS; CRYSTAL DEFECTS; CRYSTAL GROWTH; LOW ENERGY ELECTRON DIFFRACTION; MOLYBDENUM; OXIDATION; PHOTOELECTRON SPECTROSCOPY; SILICA; SILVER; SYNTHESIS (CHEMICAL);

THIN FILMS;

EID: 0141732138     PISSN: 07437463     EISSN: None     Source Type: Journal    
DOI: 10.1021/la0300075     Document Type: Article

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