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Surface and Interface Analysis

Volumn 32, Issue 1, 2001, Pages 189-192

Partial reduction of Si(IV) in SiO2 thin film by deposited metal particles: An XPS study

(3) Zhao, S J a Wang, S Q a Ye, H Q a

a INSTITUTE OF METAL RESEARCH (China)

Author keywords

Gold; Metal insulator interface; Palladium; Platinum; Silicon oxide; Silver; Surface electronic phenomena; X ray photoelectron spectroscopy

Indexed keywords

DEPOSITION; INTERFACES (MATERIALS); METAL INSULATOR BOUNDARIES; SURFACE PHENOMENA; THIN FILMS; X RAY PHOTOELECTRON SPECTROSCOPY;

DEPOSITION CHAMBERS;

SILICA;

EID: 0035420844 PISSN: 01422421 EISSN: None Source Type: Journal
DOI: 10.1002/sia.1034 Document Type: Article

Times cited : (13)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.