Defects in epitaxial insulating thin films

Journal of Physics Condensed Matter

Volumn 11, Issue 49, 1999, Pages 9943-9954

  Tegenkamp, C ^a   Pfnur H ^a   Ernst, W ^a   Malaske, U ^a   Wollschlager J ^a   Peterka, D ^a   Schroder K M ^a   Zielasek, V ^a   Henzler, M ^a  

^a LEIBNIZ UNIVERSITY HANNOVER   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

BINDING ENERGY; DESORPTION; ELECTRON ENERGY LOSS SPECTROSCOPY; ENERGY GAP; EPITAXIAL GROWTH; LOW ENERGY ELECTRON DIFFRACTION; MORPHOLOGY; NEGATIVE IONS; STACKING FAULTS; THIN FILMS; TITRATION; X RAY PHOTOELECTRON SPECTROSCOPY;

ANION VACANCY DEFECT STRUCTURE; INSULATING THIN FILMS; SPOT PROFILE ANALYSIS; THERMAL DESORPTION SPECTROSCOPY (TDS);

ELECTRIC INSULATING MATERIALS;

EID: 0038065938     PISSN: 09538984     EISSN: None     Source Type: Journal    
DOI: 10.1088/0953-8984/11/49/312     Document Type: Article

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