Characterization of surface defects on MgO thin films by ultraviolet photoelectron and metastable impact electron spectroscopies

Journal of Chemical Physics

Volumn 113, Issue 17, 2000, Pages 7564-7570

  Kolmakov, A ^a   Stultz, J ^a   Goodman, D W ^a  

^a TEXAS A AND M UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BAND STRUCTURE; CRYSTAL ORIENTATION; MOLECULAR STRUCTURE; NITROGEN COMPOUNDS; OXYGEN; PHOTOELECTRON SPECTROSCOPY; POINT DEFECTS; SURFACE PROPERTIES; THIN FILMS; ULTRAVIOLET RADIATION;

METASTABLE IMPACT ELECTRON SPECTROSCOPY;

MAGNESIA;

EID: 0034322752     PISSN: 00219606     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1313239     Document Type: Article

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