-
1
-
-
0025421826
-
Intrinsic microcrystalline silicon deposited by remote PECVD: A new thin-film photovoltaic material
-
Kissikimee, FL, USA
-
Wang, C., and Lucovsky, G.: 'Intrinsic microcrystalline silicon deposited by remote PECVD: a new thin-film photovoltaic material'. Proc. 21st IEEE Photovoltaic Specialists Conf., Kissikimee, FL, USA, 1990, pp. 1614-1618
-
(1990)
Proc. 21st IEEE Photovoltaic Specialists Conf.
, pp. 1614-1618
-
-
Wang, C.1
Lucovsky, G.2
-
2
-
-
0008039602
-
High mobility hydrogenated and oxygenated microcrystalline silicon as a photosensitive material in photovoltaic applications
-
Faraji, M., Gokhale, S., Choudhari, S.M., Takwale, M.G., and Ghaisas, S.V.: 'High mobility hydrogenated and oxygenated microcrystalline silicon as a photosensitive material in photovoltaic applications', Appl. Phys. Lett., 1992, 60, pp. 3289-3291
-
(1992)
Appl. Phys. Lett.
, vol.60
, pp. 3289-3291
-
-
Faraji, M.1
Gokhale, S.2
Choudhari, S.M.3
Takwale, M.G.4
Ghaisas, S.V.5
-
3
-
-
12844282265
-
Complete microcrystalline p-i-n solar cell-crystalline or amorphous cell behavior?
-
Meier, J., Flückiger, R., Keppner, H., and Shah, A.: 'Complete microcrystalline p-i-n solar cell-crystalline or amorphous cell behavior?", Appl. Phys. Lett., 1994, 65, pp. 860-862
-
(1994)
Appl. Phys. Lett.
, vol.65
, pp. 860-862
-
-
Meier, J.1
Flückiger, R.2
Keppner, H.3
Shah, A.4
-
4
-
-
21544455021
-
Reversible conductivity charge in discharge-produced amorphous Si
-
Staebler, D.L., and Wronski, C.R.: 'Reversible conductivity charge in discharge-produced amorphous Si', Appl. Phys. Lett., 1977, 31, pp. 292-294
-
(1977)
Appl. Phys. Lett.
, vol.31
, pp. 292-294
-
-
Staebler, D.L.1
Wronski, C.R.2
-
5
-
-
0033879621
-
Intrinsic microcrystalline silicon: A new material for photovoltaics
-
Vetterl, O., Finger, F., Carius, R., Hapke, P., Houben, L., Kluth, O., Lambertz, A., Mück, A., Rech, B., and Wagner, H.: 'Intrinsic microcrystalline silicon: a new material for photovoltaics', Sol. Energy Mater. Sol. Cells, 2000, 62, pp. 97-108
-
(2000)
Sol. Energy Mater. Sol. Cells
, vol.62
, pp. 97-108
-
-
Vetterl, O.1
Finger, F.2
Carius, R.3
Hapke, P.4
Houben, L.5
Kluth, O.6
Lambertz, A.7
Mück, A.8
Rech, B.9
Wagner, H.10
-
6
-
-
0037082078
-
Microcrystalline silicon prepared by hot-wire chemical vapour deposition for thin film solar cell applications
-
Klein, S., Wolff, J., Finger, F., Carius, R., Wagner, H., and Stutzmann, M.: 'Microcrystalline silicon prepared by hot-wire chemical vapour deposition for thin film solar cell applications', Jpn. J. Appl. Phys. 2, Lett., 2002, 41, pp. L10-L12
-
(2002)
Jpn. J. Appl. Phys. 2, Lett.
, vol.41
-
-
Klein, S.1
Wolff, J.2
Finger, F.3
Carius, R.4
Wagner, H.5
Stutzmann, M.6
-
7
-
-
0036919017
-
High efficiency thin film solar cells with intrinsic microcrystalline silicon prepared by hot wire CVD
-
Klein, S., Finger, F., Carius, R., Rech, B., Houben, L., Luysberg, M., and Stutzmann, M.: 'High efficiency thin film solar cells with intrinsic microcrystalline silicon prepared by hot wire CVD', Mater. Res. Soc. Symp. Proc., 2002, 715, p. A26.2
-
(2002)
Mater. Res. Soc. Symp. Proc.
, vol.715
-
-
Klein, S.1
Finger, F.2
Carius, R.3
Rech, B.4
Houben, L.5
Luysberg, M.6
Stutzmann, M.7
-
8
-
-
0034431040
-
-
Vetterl, O., Carius, R., Houben, L., Scholten, C., Luysberg, M., Lambertz, A., Finger, F., and Wagner, H.: Mater. Res. Soc. Symp. Proc., 2000, 609, p. A15.2
-
(2000)
Mater. Res. Soc. Symp. Proc.
, vol.609
-
-
Vetterl, O.1
Carius, R.2
Houben, L.3
Scholten, C.4
Luysberg, M.5
Lambertz, A.6
Finger, F.7
Wagner, H.8
-
9
-
-
0042093785
-
Defect density and recombination lifetime in microcrystalline silicon absorbers of highly efficient thin-film solar cells determined by numerical device simulations
-
Brammer, T., and Stiebig, H.: 'Defect density and recombination lifetime in microcrystalline silicon absorbers of highly efficient thin-film solar cells determined by numerical device simulations', J. Appl. Phys., 2003, 94, p. 1035
-
(2003)
J. Appl. Phys.
, vol.94
, pp. 1035
-
-
Brammer, T.1
Stiebig, H.2
-
10
-
-
0035557032
-
Structural properties of microcrystalline Si solar cells
-
Luysberg, M., Scholten, C., Houben, L., Carius, R., Finger, F., and Vetterl, O.: 'Structural properties of microcrystalline Si solar cells', Mater. Res. Soc. Symp. Proc., 2001, 664, p. A15.2
-
(2001)
Mater. Res. Soc. Symp. Proc.
, vol.664
-
-
Luysberg, M.1
Scholten, C.2
Houben, L.3
Carius, R.4
Finger, F.5
Vetterl, O.6
-
11
-
-
0036531441
-
Growth of microcrystalline nip Si solar cells: Role of local epitaxy
-
Houben, L., Scholten, C., Luysberg, M., Vetterl, O., Finger, F., and Carius, R.: 'Growth of microcrystalline nip Si solar cells: role of local epitaxy', J. Non-Cryst. Solids, 2002, 299-302, pp. 1189-1193
-
(2002)
J. Non-cryst. Solids
, vol.299-302
, pp. 1189-1193
-
-
Houben, L.1
Scholten, C.2
Luysberg, M.3
Vetterl, O.4
Finger, F.5
Carius, R.6
-
12
-
-
0037850818
-
Intrinsic microcrystalline silicon by hot-wire CVD for thin film solar cells
-
Klein, S., Finger, F., Carius, R., Dylla, T., Rech, B., Grimm, M., Houben, L., and Stutzmann, M.: 'Intrinsic microcrystalline silicon by hot-wire CVD for thin film solar cells', Thin Solid Films, 2003, 430, p. 202
-
(2003)
Thin Solid Films
, vol.430
, pp. 202
-
-
Klein, S.1
Finger, F.2
Carius, R.3
Dylla, T.4
Rech, B.5
Grimm, M.6
Houben, L.7
Stutzmann, M.8
-
13
-
-
0012632186
-
Properties of microcrystalline silicon. IV. Electrical conductivity, electron spin resonance and the effect of gas adsorption
-
Vepřek, S., Iqpal, Z., Kühne, R.O., Capezzuto, P., Sarott, F.-A., and Gimzewski, J.K.: 'Properties of microcrystalline silicon. IV. Electrical conductivity, electron spin resonance and the effect of gas adsorption', J. Phys. C, Solid State Phys., 1983, 16, pp. 2641-264
-
(1983)
J. Phys. C, Solid State Phys.
, vol.16
, pp. 2641-264
-
-
Vepřek, S.1
Iqpal, Z.2
Kühne, R.O.3
Capezzuto, P.4
Sarott, F.-A.5
Gimzewski, J.K.6
-
14
-
-
0036531712
-
Changes in electric and optical properties of intrinsic microcrystalline silicon upon variation or the structural composition
-
Vetterl, O., Gross, A., Jana, T., Ray, S., Lambertz, A., Carius, R., and Finger, F.: 'Changes in electric and optical properties of intrinsic microcrystalline silicon upon variation or the structural composition', J. Non-Cryst. Solids., 2002, 299-302, pp. 772-777
-
(2002)
J. Non-cryst. Solids
, vol.299-302
, pp. 772-777
-
-
Vetterl, O.1
Gross, A.2
Jana, T.3
Ray, S.4
Lambertz, A.5
Carius, R.6
Finger, F.7
-
15
-
-
0036914147
-
Defects in microcrystalline silicon prepared with hot wire CVD
-
Finger, F., Klein, S., Dylla, T., Baia Neto, A.L., Vetterl, O., and Carius, R.: 'Defects in microcrystalline silicon prepared with hot wire CVD', Mater. Res. Soc. Symp. Proc., 2002, 715, p. A16.3
-
(2002)
Mater. Res. Soc. Symp. Proc.
, vol.715
-
-
Finger, F.1
Klein, S.2
Dylla, T.3
Baia Neto, A.L.4
Vetterl, O.5
Carius, R.6
-
16
-
-
0003223952
-
-
Brüggemann, R., Hierzenberger, A., Wanka, H.N., and Schubert, M.B.: Mater. Res. Soc. Symp. Proc., 1998, 507, p. 921
-
(1998)
Mater. Res. Soc. Symp. Proc.
, vol.507
, pp. 921
-
-
Brüggemann, R.1
Hierzenberger, A.2
Wanka, H.N.3
Schubert, M.B.4
-
17
-
-
0032634463
-
-
Kanschat, P., Lips, K., Brüggemann, R., Hierzenberger, A., Sieber, I., and Fuhs, W.: Mater. Res. Soc. Symp. Proc., 1998, 507, p. 793
-
(1998)
Mater. Res. Soc. Symp. Proc.
, vol.507
, pp. 793
-
-
Kanschat, P.1
Lips, K.2
Brüggemann, R.3
Hierzenberger, A.4
Sieber, I.5
Fuhs, W.6
-
18
-
-
0142258617
-
-
Benninghoven, A., Bertrand, P., Migeon, H.-N. and Werner, H.W. (Eds.), Elsevier Science B.V., Amsterdam
-
Muck, A., Zastrow, U., Vetterl, O., and Rech, B.: in Benninghoven, A., Bertrand, P., Migeon, H.-N. and Werner, H.W. (Eds.) 'Secondary ion mass spectrometry SIMS XII' (Elsevier Science B.V., Amsterdam, 2000), p. 689
-
(2000)
Secondary Ion Mass Spectrometry SIMS XII
, pp. 689
-
-
Muck, A.1
Zastrow, U.2
Vetterl, O.3
Rech, B.4
-
19
-
-
0037081438
-
Hydrogen-induced metastable changes in the electrical conductivity of microcrystalline silicon
-
Nickel, N., and Rakel, M.: 'Hydrogen-induced metastable changes in the electrical conductivity of microcrystalline silicon', Phys. Rev. B, 2001, 65, pp. 041301/1-4
-
(2001)
Phys. Rev. B
, vol.65
, pp. 0413011-0413014
-
-
Nickel, N.1
Rakel, M.2
-
20
-
-
0031361444
-
Transport and recombination channels in undoped microcrystalline silicon studied by ESR and EDMR
-
Will, D., Lerner, C., Funs, W., and Lips, K.: 'Transport and recombination channels in undoped microcrystalline silicon studied by ESR and EDMR', Mat. Res. Soc. Symp. Proc., 1997, 467, pp. 361-366
-
(1997)
Mat. Res. Soc. Symp. Proc.
, vol.467
, pp. 361-366
-
-
Will, D.1
Lerner, C.2
Funs, W.3
Lips, K.4
-
21
-
-
0032105305
-
Structural properties of microcrystalline silicon' in the transition from highly crystalline to amorphous growth
-
Houben, L., Luysberg, M., Hapke, P., Carius, R., Finger, F., and Wagner, H.: 'Structural properties of microcrystalline silicon' in the transition from highly crystalline to amorphous growth', Philos. Mag. A, 1998, 77, pp. 1447-1460
-
(1998)
Philos. Mag. A
, vol.77
, pp. 1447-1460
-
-
Houben, L.1
Luysberg, M.2
Hapke, P.3
Carius, R.4
Finger, F.5
Wagner, H.6
-
22
-
-
0001580115
-
Electronic states in hydrogenated microcrystalline silicon
-
Finger, F., Müller, I., Malten, C., and Wagner, H.: 'Electronic states in hydrogenated microcrystalline silicon', Philos. Mag. B, 1998, 77, pp. 805-830
-
(1998)
Philos. Mag. B
, vol.77
, pp. 805-830
-
-
Finger, F.1
Müller, I.2
Malten, C.3
Wagner, H.4
-
23
-
-
0037511066
-
Electron spin resonance investigation of electronic states in hydrogenated microcrystalline silicon
-
Müller, J., Finger, F., Carius, R., and Wagner, H.: 'Electron spin resonance investigation of electronic states in hydrogenated microcrystalline silicon', Phys. Rev. B, 1999, 60, pp. 11666-11677
-
(1999)
Phys. Rev. B
, vol.60
, pp. 11666-11677
-
-
Müller, J.1
Finger, F.2
Carius, R.3
Wagner, H.4
-
24
-
-
0038969740
-
Structure and growth of hydrogenated microcrystalline silicon; investigation by transmission electron microscopy and Raman spectroscopy of films grown at different plasma excitation frequencies
-
Luysberg, M., Hapke, P., Carius, R., and Finger, F.: 'Structure and growth of hydrogenated microcrystalline silicon; investigation by transmission electron microscopy and Raman spectroscopy of films grown at different plasma excitation frequencies', Philos. Mag. A, 1997, 75, pp. 31-47
-
(1997)
Philos. Mag. A
, vol.75
, pp. 31-47
-
-
Luysberg, M.1
Hapke, P.2
Carius, R.3
Finger, F.4
-
25
-
-
0345849822
-
Nucleation and growth analysis of microcrystalline silicon by scanning probe microscopy: Substrate dependence, local structural and electronic properties of as-grown surfaces
-
Ross, C., Herion, J., and Wagner, H.: 'Nucleation and growth analysis of microcrystalline silicon by scanning probe microscopy: substrate dependence, local structural and electronic properties of as-grown surfaces', J. Non-Cryst. Solids, 2000, 266-269, pp. 69-73
-
(2000)
J. Non-cryst. Solids
, vol.266-269
, pp. 69-73
-
-
Ross, C.1
Herion, J.2
Wagner, H.3
-
26
-
-
0000624007
-
Evolution of the microstructure in microcrystalline silicon prepared by very high frequency glow-discharge using hydrogen dilution
-
Vallat-Sauvain, E., Kroll, U., Meier, J., Shah, A., and Pohl, J.: 'Evolution of the microstructure in microcrystalline silicon prepared by very high frequency glow-discharge using hydrogen dilution', J. Appl. Phys., 2000, 87, pp. 3137-3142
-
(2000)
J. Appl. Phys.
, vol.87
, pp. 3137-3142
-
-
Vallat-Sauvain, E.1
Kroll, U.2
Meier, J.3
Shah, A.4
Pohl, J.5
-
28
-
-
0001663432
-
In situ ellipsometry of thin-film deposition: Implications for amorphous and microcrystalline Si growth
-
Collins, R.W., and Yang, B.Y.: 'In situ ellipsometry of thin-film deposition: Implications for amorphous and microcrystalline Si growth', J. Vac. Sci. Technol. B, 1989, 7, pp. 1155-1164
-
(1989)
J. Vac. Sci. Technol. B
, vol.7
, pp. 1155-1164
-
-
Collins, R.W.1
Yang, B.Y.2
-
29
-
-
0035801178
-
Intrinsic amorphous and microcrystalline silicon by hot-wire-deposition for thin film solar cell applications
-
Klein, S., Finger, F., Carius, R., Wagner, H., and Stutzmann, M.: 'Intrinsic amorphous and microcrystalline silicon by hot-wire-deposition for thin film solar cell applications', Thin Solid Films, 2001, 395, pp. 305-309
-
(2001)
Thin Solid Films
, vol.395
, pp. 305-309
-
-
Klein, S.1
Finger, F.2
Carius, R.3
Wagner, H.4
Stutzmann, M.5
-
30
-
-
0020847025
-
Vibrational spectroscopy of hydrogenated evaporated amorphous silicon films
-
Kniffler, N., Schröder, B., and Geiger, J.: 'Vibrational spectroscopy of hydrogenated evaporated amorphous silicon films', J. Non-Cryst. Solids, 1983, 58, pp. 153-163
-
(1983)
J. Non-cryst. Solids
, vol.58
, pp. 153-163
-
-
Kniffler, N.1
Schröder, B.2
Geiger, J.3
-
31
-
-
0001625753
-
Device grade microcrystalline silicon owing to reduced oxygen contamination
-
Torres, P., Meier, J., Flückiger, R., Kroll, U., Anna Selvan, J.A., Keppner, H., Shah, A., Littlewood, S.D., Kelly, I.E., and Giannoules, P.: 'Device grade microcrystalline silicon owing to reduced oxygen contamination', Appl. Phys. Lett., 1996, 69, pp. 1373-1375
-
(1996)
Appl. Phys. Lett.
, vol.69
, pp. 1373-1375
-
-
Torres, P.1
Meier, J.2
Flückiger, R.3
Kroll, U.4
Anna Selvan, J.A.5
Keppner, H.6
Shah, A.7
Littlewood, S.D.8
Kelly, I.E.9
Giannoules, P.10
-
32
-
-
0035556404
-
-
Kamei, T., Wada, T., and Matsuda, A.: Mater. Res. Soc. Symp. Proc., 2001, 664, p. A10.1.1
-
(2001)
Mater. Res. Soc. Symp. Proc.
, vol.664
-
-
Kamei, T.1
Wada, T.2
Matsuda, A.3
-
33
-
-
0003371040
-
Oxygen in silicon
-
Academic Press, San Diego, CA, USA
-
Shimura, F. (Ed.): 'Oxygen in silicon' Semiconductors and Semimetals, vol. 42, (Academic Press, San Diego, CA, USA, 1994)
-
(1994)
Semiconductors and Semimetals
, vol.42
-
-
Shimura, F.1
-
34
-
-
0024752256
-
The defect density in amorphous silicon
-
Stutzmann, M.: "The defect density in amorphous silicon', Philos. Mag. B, 1989, 60, pp. 531-546
-
(1989)
Philos. Mag. B
, vol.60
, pp. 531-546
-
-
Stutzmann, M.1
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