Design of Reconfigurable Access Wrappers for Embedded Core Based SoC Test

IEEE Transactions on Very Large Scale Integration (VLSI) Systems

Volumn 11, Issue 5, 2003, Pages 955-960

  Koranne, Sandeep ^a  

^a Tanner Research Inc   (United States)

Author keywords

Design for testability; Embedded core test; Integrated circuit testing; System on chip (SoC) test

Indexed keywords

ALGORITHMS; EMBEDDED SYSTEMS; SCHEDULING; VLSI CIRCUITS;

ACCESS WRAPPERS;

SYSTEMS ENGINEERING;

EID: 0142258179     PISSN: 10638210     EISSN: None     Source Type: Journal    
DOI: 10.1109/TVLSI.2003.817128     Document Type: Article

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