Test requirements for embedded core-based systems and IEEE P1500

IEEE International Test Conference (TC)

Volumn , Issue , 1997, Pages 191-199

  Zorian, Yervant ^a  

^a LogicVision Inc   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

INTELLECTUAL PROPERTY; INTERFACES (COMPUTER); STANDARDS;

EMBEDDED CORE BASED SYSTEMS; SYSTEM ON CHIP TEST;

INTEGRATED CIRCUIT TESTING;

EID: 0031367231     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (20)