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Volumn 83, Issue 11, 2003, Pages 2259-2261

Narrow features in metals at the interfaces between different etch resists

Author keywords

[No Author keywords available]

Indexed keywords

CYANIDES; ELECTRIC RESISTANCE; ETCHING; FABRICATION; GOLD; INTERFACES (MATERIALS); SELF ASSEMBLY; SULFUR COMPOUNDS;

EID: 0142121573     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1611640     Document Type: Article
Times cited : (11)

References (17)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.