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Volumn 83, Issue 11, 2003, Pages 2259-2261
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Narrow features in metals at the interfaces between different etch resists
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Author keywords
[No Author keywords available]
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Indexed keywords
CYANIDES;
ELECTRIC RESISTANCE;
ETCHING;
FABRICATION;
GOLD;
INTERFACES (MATERIALS);
SELF ASSEMBLY;
SULFUR COMPOUNDS;
PHOTORESIST LAYERS;
NANOSTRUCTURED MATERIALS;
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EID: 0142121573
PISSN: 00036951
EISSN: None
Source Type: Journal
DOI: 10.1063/1.1611640 Document Type: Article |
Times cited : (11)
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References (17)
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