An automated design system methodology and strategy for electrostatic discharge protection circuits in RF CMOS and BiCMOS silicon germanium technology

Journal of Electrostatics

Volumn 59, Issue 3-4, 2003, Pages 257-283

  Voldman, Steven H ^a   Strang, Susan E ^a   Jordan, Donald ^a  

^a IBM   (United States)

Author keywords

Automatic generation; CAD; Design systems; ESD; P cells; RF

Indexed keywords

AUTOMATION; CMOS INTEGRATED CIRCUITS; HUMAN FORM MODELS; MICROPROCESSOR CHIPS; OPTIMIZATION; PARAMETER ESTIMATION;

RADIO FREQUENCY CIRCUITS;

ELECTROSTATICS;

ELECTROSTATICS;

EID: 0141905771     PISSN: 03043886     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0304-3886(03)00105-0     Document Type: Article

References (22)

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