Design automation methodology and rf/analog modeling for rf CMOS and SiGe BiCMOS technologies

IBM Journal of Research and Development

Volumn 47, Issue 2-3, 2003, Pages 139-175

  Harame, David L ^a   Newton, Kim M ^a   Singh, Raminderpal ^a   Sweeney, Susan L ^a   Strang, Sue E ^a   Johnson, Jeffrey B ^a   Parker, Scott M ^a   Dickey, Carl E ^a   Erturk, Mete ^a   Schulberg, Greg J ^a   Jordan, Donald L ^a   Sheridan, David C ^a   Keene, Michael P ^a   Boquet, John ^a   Groves, Robert A ^a   Kumar, Mukesh ^a   Herman Jr , Dean A ^b   Meyerson, Bernard S ^b  

^a IBM MICROELECTRONICS   (United States)

^b IBM T J WATSON RESEARCH CENTER   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AUTOMATION; ELECTRIC LINES; STATISTICAL METHODS; TELECOMMUNICATION;

DESIGN AUTOMATION;

CMOS INTEGRATED CIRCUITS;

EID: 0038699479     PISSN: 00188646     EISSN: None     Source Type: Journal    
DOI: 10.1147/rd.472.0139     Document Type: Review

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