State of the art of electrostatic discharge protection: Physics, technology, circuits, design, simulation and scaling

Proceedings of the IEEE Bipolar/BiCMOS Circuits and Technology Meeting

Volumn , Issue , 1998, Pages 19-30

  Voldman, Steven H ^a  

^a IBM RESEARCH   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; ELECTRIC DISCHARGES; ELECTRIC NETWORK ANALYSIS; ELECTROSTATICS; SEMICONDUCTOR DEVICE MANUFACTURE;

ELECTROSTATIC DISCHARGE (ESD) PROTECTION;

ELECTRIC EQUIPMENT PROTECTION;

EID: 0032309225     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (80)