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Volumn 454, Issue 1, 2000, Pages 73-113

High-resolution imaging X-ray spectrometers

Author keywords

[No Author keywords available]

Indexed keywords

CHARGE COUPLED DEVICES; FLUORESCENCE; QUANTUM EFFICIENCY; RADIATION HARDENING; SILICON SENSORS; X RAY ANALYSIS; X RAY SPECTROGRAPHS;

EID: 0141821222     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-9002(00)00811-1     Document Type: Article
Times cited : (65)

References (81)
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    • (1999) ESA Bulletin , vol.100 , Issue.SPECIAL ISSUE , pp. 1
  • 23
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    • Silicon drift detector - The key to new experiments
    • Springer, Berlin
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    • (1998) In: Naturwissenschaften , vol.85 , pp. 539-343
    • Strüder, L.1    Lechner, P.2    Leutenegger, P.3
  • 32
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    • X-flash detector
    • RÖNTEC GmbH, Rudower Chaussee 6, Geb. 19.1 / 2, D-12489 Berlin
    • RÖNTEC GmbH, Rudower Chaussee 6, Geb. 19.1 / 2, D-12489 Berlin, X-flash detector, Product Inform. 98 / 99(4) (1999).
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    • Silicon drift detector with on-chip-electronics for XRF
    • KETEK GmbH, Am Isarbach 30, D-85764 Oberschleißheim
    • KETEK GmbH, Am Isarbach 30, D-85764 Oberschleißheim, Silicon drift detector with on-chip-electronics for XRF, Product Inform. 1(4) (1999) 8.
    • (1999) Product Inform. , vol.1 , Issue.4 , pp. 8
  • 56
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    • Grazing incidence reflection of protons
    • to be published. Presentation given at the ESA Radiation Damage Meeting on October 21, 1999 at ESTEC, Noordwijk, The Netherlands
    • B. Aschenbach, Grazing incidence reflection of protons. Nucl. Instr. and Meth. A (2001) to be published. Presentation given at the ESA Radiation Damage Meeting on October 21, 1999 at ESTEC, Noordwijk, The Netherlands.
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    • Aschenbach, B.1
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    • Silicon pixel detectors for future X-ray missions
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.