Ultrathin entrance windows for silicon drift detectors

Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Volumn 387, Issue 1-2, 1997, Pages 250-254

  Hartmann, R ^a   Struder L ^a   Kemmer, J ^b   Lechner, P ^b   Fries, O ^c   Lorenz, E ^c   Mirzoyan, R ^c  

^a MPI HALBLEITERLABOR   (Germany)

^b KETEK GMBH   (Germany)

^c MAX PLANCK INSTITUT FÜR PHYSIK   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ALPHA PARTICLES; AMERICIUM; QUANTUM EFFICIENCY; READOUT SYSTEMS; SEMICONDUCTING SILICON; SEMICONDUCTOR DEVICE MANUFACTURE; SEMICONDUCTOR JUNCTIONS; X RAYS;

SILICON DRIFT DETECTORS (SDD); ULTRATHIN ENTRANCE WINDOWS;

PHOTODETECTORS;

EID: 0031098370     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-9002(96)01000-5     Document Type: Article

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