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Volumn 439, Issue 2, 2000, Pages 319-336
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Particle and X-ray damage in pn-CCDs
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Author keywords
[No Author keywords available]
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Indexed keywords
ALPHA PARTICLES;
CHARGE COUPLED DEVICES;
CHARGE TRANSFER;
ELECTRIC CURRENTS;
IMAGING TECHNIQUES;
PROTON IRRADIATION;
RADIATION DAMAGE;
SATELLITES;
SEMICONDUCTOR JUNCTIONS;
SPECTROSCOPY;
X RAY ANALYSIS;
DARK CURRENTS;
PARTICLE DETECTORS;
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EID: 0033876870
PISSN: 01689002
EISSN: None
Source Type: Journal
DOI: 10.1016/S0168-9002(99)00910-9 Document Type: Article |
Times cited : (16)
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References (9)
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