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Volumn 439, Issue 2, 2000, Pages 319-336

Particle and X-ray damage in pn-CCDs

Author keywords

[No Author keywords available]

Indexed keywords

ALPHA PARTICLES; CHARGE COUPLED DEVICES; CHARGE TRANSFER; ELECTRIC CURRENTS; IMAGING TECHNIQUES; PROTON IRRADIATION; RADIATION DAMAGE; SATELLITES; SEMICONDUCTOR JUNCTIONS; SPECTROSCOPY; X RAY ANALYSIS;

EID: 0033876870     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-9002(99)00910-9     Document Type: Article
Times cited : (16)

References (9)
  • 3
    • 0042100964 scopus 로고    scopus 로고
    • D. Lumb et al., Proc. SPIE 2808 (1996) 326.
    • (1996) Proc. SPIE , vol.2808 , pp. 326
    • Lumb, D.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.