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Volumn 439, Issue 2, 2000, Pages 547-559

Fabrication, test and performance of very large X-ray CCDs designed for astrophysical applications

Author keywords

[No Author keywords available]

Indexed keywords

ASTROPHYSICS; CAMERAS; CHARGE COUPLED DEVICES; PHOTODETECTORS; QUANTUM EFFICIENCY; X RAYS;

EID: 0033901961     PISSN: 01689002     EISSN: None     Source Type: None    
DOI: 10.1016/S0168-9002(99)00938-9     Document Type: Article
Times cited : (12)

References (19)
  • 2
    • 0032305107 scopus 로고    scopus 로고
    • P. Friedrich, SPIE 3444 (1998) 342.
    • (1998) SPIE , vol.3444 , pp. 342
    • Friedrich, P.1
  • 15
    • 85031582965 scopus 로고    scopus 로고
    • Defect induced charge transfer losses in high resistivity float zone silicon charge coupled devices
    • Electrochemical Society
    • H. Soltau, N. Krause, N. Meidinger et al., Defect induced charge transfer losses in high resistivity float zone silicon charge coupled devices, in: Symposium on High Purity Silicon IV, Vol. 96-13, Electrochemical Society, 1996, pp. 325.
    • (1996) Symposium on High Purity Silicon IV , vol.96 , Issue.13 , pp. 325
    • Soltau, H.1    Krause, N.2    Meidinger, N.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.