Multichannel silicon drift detectors for X-ray spectroscopy

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 4012, Issue , 2000, Pages 592-599

  Lechner, P ^a   Buttler, W ^a   Fiorini, C ^a   Hartmann, R ^a   Kemmer, J ^a   Krause, N ^a   Leutenegger, P ^a   Longoni, A ^a   Soltau, H ^a   Stoetter, D ^a   Stoetter, R ^a   Strueder, L ^a   Weber, U ^a  

^a KETEK GMBH   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITANCE; LEAKAGE CURRENTS; RADIATION DETECTORS; READOUT SYSTEMS; SILICON;

SILICON DRIFT DETECTORS (SDD); X RAY DETECTORS;

X RAY SPECTROSCOPY;

EID: 0033697131     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (20)